ATS 2006 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Committees -- More Information

Scope

The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of system, board and device testing with design, manufacturing and field considerations in mind. The official language of the symposium is English. Topics of interest include, but are not limited to:

Automatic Test Generation / Fault Simulation
Synthesis for Testability / Design for Testability
Built-In Self-Test / On-line Testing
Software Testing / Software Design for Testing
Fault Modeling & Diagnosis
Mixed-Signal Test
Network Protocol Testing
Design Verification
Electron-Beam Testing
Economics of Test
Fault Tolerance
IDDQ Test
System-on-Chip Test

Submissions

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REGULAR SESSION : The ATS’06 Program Committee invites original, unpublished paper submissions for ATS’06. Paper submissions should be complete manuscripts, not extending six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, fax number, and e-mail address of the contact author. A 50-words abstract and five keywords are also required.

All submissions are to be made electronically through the ATS’06 website. Detailed instructions for submissions are to be found at the ATS’06 website. Electronic submissions (PDF or PS files) are strongly recommended. In case of hardcopy submission one should contact to Program Chair for special instructions.

The submission will be considered evidence that upon acceptance the author(s) will prepare the final manuscript (six pages for regular session) in time for inclusion in the proceedings and will present the paper at the Symposium.

INDUSTRY SESSION : This session will address a wide range of practical problems in LSI test, board and system test, diagnosis, failure analysis, design verification, and so on. This session will consist of brief presentations followed by poster presentations. A one-page abstract is required for submission. Each submission should also include the complete address and designate a contact person and a presenter. All submission should be mailed to Industrial Arrangement Chair (industrial@aries30.cse.kyutech.ac.jp).

Key Dates

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REGULAR SESSION

Submission deadline: May 10, 2006
Notification of acceptance: July 10, 2006
Camera ready copy: August 10, 2006
Symposium: November 20-23, 2006

INDUSTRY SESSION

Submission deadline: June 23, 2006
Notification of acceptance: July 10, 2006
Camera ready final manuscript (one-page abstract): August 10, 2006

Committees

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General Chair

Hiromi Hiraishi
Kyoto Sangyo University

General Vice-Chair

Hideo Tamamoto
Akita University

Program Chair

Seiji Kajihara
Kyushu Institute ofTechnology

Tutorial Chair

Takashi Aikyo
Fujitsu Ltd.

Publicity Chair

Hiroshi Takahashi
Ehime University

Publications Chair

Toshinori Hosokawa
Nihon University

Finance Chair

Tomoo Inoue
Hiroshima City University

Local Arrangement Chair

Hiroshi Date
System JD Co., Ltd.

Registration Chair

Satoshi Ohtake
Nara Institute of Science and Technology

Industrial Arrangement Chair

Kazumi Hatayama
Renesas Technology Corp.

Audio Visual Chair

Yukihiro Iguchi
Meiji University

Secretary

Yukiya Miura
Tokyo MetropolitanUniversity

North American Liaison

Alex Orailoglu
University of California, San Diego

European Liaison

Michel Renovell
LIRMM

Ex Officio

Hideo Fujiwara
Nara Institute of Science and Technology

Program Committee Members:

J. Abraham
V. D. Agrawal
K. Chakrabarty
T. T. Cheng
W.-T. Cheng
D. R. Chowdhury
S. Demidenko
P. Girard
M. Hashizume
Y. Higami
S.Y. Huang
M. L. Huawei
H. Ichihara
M. Inoue
H. Itoh
A. Ivanov
K. Iwasaki
S. Kang
C. Landrault
E. Larsson
C.-L. Lee
K.-J. Lee
X. Li
E. J. Marinissen
F. Muradali
Y. Okuda
N. Otsuka
P. P. Chaudhuri
I. Polian
P. Printetto
J. Rajski
R. Rajsuman
S. M. Reddy
A. Rubio
K. K. Saluja
Y. Sato
T. Shinogi
C.C. Su
A. Uzzaman
X. Wen
T.W. Williams
C.-W. Wu
S. Xu
T. Yamaguchi
M. Yoshida
M. Yoshimura

More Information

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For general information:

General Chair Hiromi Hiraishi (gc@ats06.kyoto-su.ac.jp)

For regular session information:

Program Chair Seiji Kajihara (ats06-pc@ares30.cse.kyutech.ac.jp)

For industry session information:

Industrial Arrangement Chair Kazumi Hatayama (industrial@aries30.cse.kyutech.ac.jp)

For more information, visit us on the web at: http://ats06.cs.ehime-u.ac.jp/

The Fifteenth Asian Test Symposium (ATS'06) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC), the Technical Group on Dependable Computing, and the IEICE Kyushu Institute of Technology (approval pending) .

TTTC's Electronic Broadcasting Service
	Fifteenth Asian Test Symposium (ATS'06) November 20-23, 2006 Software Research Park Fukuoka, Japan http://ats06.cs.ehime-u.ac.jp/